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The Goodness of Simultaneous Fits in ISIS

Rothschild, Richard E.; Fürst, Felix; Klochkov, Dmitry +15 more

In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a simultaneous fit quality. We present three ways to…