Evidence for an Elongated (>60 Ion Skin Depths) Electron Diffusion Region during Fast Magnetic Reconnection
Eastwood, J. P.; Phan, T. D.; Mozer, F. S.; Drake, J. F.; Shay, M. A.
United States
Abstract
Observations of an extremely elongated electron diffusion region occurring during fast reconnection are presented. Cluster spacecraft in situ observations of an expanding reconnection exhaust reveal a broad current layer (∼10 ion skin depths thick) supporting the reversal of the reconnecting magnetic field together with an intense current embedded at the center that is due to a super-Alfvénic electron outflow jet with transverse scale of ∼9 electron skin depths. The electron jet extends at least 60 ion skin depths downstream from the X-line.