JEM-X science analysis software
Hornstrup, A.; Oxborrow, C. A.; Huovelin, J.; Maisala, S.; Westergaard, N. J.; Kretschmar, P.; Lund, N.; Larsson, S.; Brandt, S.; Rasmussen, I. L.; Budtz-Jørgensen, C.; Martínez Núñez, S.
Denmark, Germany, Switzerland, Sweden, Finland, Spain
Abstract
The science analysis of the data from JEM-X on INTEGRAL is performed through a number of levels including corrections, good time selection, imaging and source finding, spectrum and light-curve extraction. These levels consist of individual executables and the running of the complete analysis is controlled by a script where parameters for detailed settings are introduced. The end products are FITS files with a format compatible with standard analysis packages such as XSPEC.