Self-Charge-Filling (SCF) Effect of Suzaku XIS
Kitamoto, Shunji; Murakami, Hiroshi; Yoshida, Yuki; Todoroki, Shotaro
Japan
Abstract
We demonstrate the importance of the self-charge-filling (SCF) effect for the analysis of bright and line-rich sources with the Suzaku X-ray imaging spectrometer (XIS) if spaced-row charge injection (SCI) is not applied. The SCF-effect changes the central energy of lines depending on the extracted region or the event densities of the images. We propose a correction method of the SCF-effect and show its validity by applying it to the extraction of the spectra of Cygnus X-3.