Quantification of the order overlap problem for IUE high resolution spectra (SWP camera). A correction algorithm.
Bianchi, L.; Bohlin, R. C.
Italy, United States
Abstract
A quantification of the order overlap in IUE high resolution spectra is obtained, for the SWP camera, by comparison of line depths measured in IUE and Copernicus spectra. The amount of order overlap is found to be about 32 percent of the net spectrum at 1150 A, decreasing to zero at about 1400 A, for data extracted with the most recent production software (Bohlin and Turnrose, 1982). In the spectra extracted with the older software, the order overlap is worse by about 10 percent. A correction technique is described, based on the results found in this work.